JPH0283465U - - Google Patents

Info

Publication number
JPH0283465U
JPH0283465U JP16265688U JP16265688U JPH0283465U JP H0283465 U JPH0283465 U JP H0283465U JP 16265688 U JP16265688 U JP 16265688U JP 16265688 U JP16265688 U JP 16265688U JP H0283465 U JPH0283465 U JP H0283465U
Authority
JP
Japan
Prior art keywords
view
forth
thin layer
layer chromatography
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16265688U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16265688U priority Critical patent/JPH0283465U/ja
Publication of JPH0283465U publication Critical patent/JPH0283465U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Sampling And Sample Adjustment (AREA)
JP16265688U 1988-12-14 1988-12-14 Pending JPH0283465U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16265688U JPH0283465U (en]) 1988-12-14 1988-12-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16265688U JPH0283465U (en]) 1988-12-14 1988-12-14

Publications (1)

Publication Number Publication Date
JPH0283465U true JPH0283465U (en]) 1990-06-28

Family

ID=31446679

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16265688U Pending JPH0283465U (en]) 1988-12-14 1988-12-14

Country Status (1)

Country Link
JP (1) JPH0283465U (en])

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6283662A (ja) * 1985-10-09 1987-04-17 Toshiba Corp 薄層クロマトグラフイ−による成分抽出方法
JPH01187452A (ja) * 1988-01-22 1989-07-26 Sankyo Co Ltd 赤外吸収測定用デイスクの製造方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6283662A (ja) * 1985-10-09 1987-04-17 Toshiba Corp 薄層クロマトグラフイ−による成分抽出方法
JPH01187452A (ja) * 1988-01-22 1989-07-26 Sankyo Co Ltd 赤外吸収測定用デイスクの製造方法

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